Advanced X-Ray Optics Metrology
for Nano-focusing and Coherence Preservation
for Nano-focusing and Coherence Preservation
With permission from the speakers, we will make the workshop presentations available as we receive them.
Presentations
- Howard Padmore LBNL
X-ray Optics: New Challenges and Opportunities - Kazuto Yamauchi Osaka U
Recent achievements and next strategies in hard-x-ray nano-focusing - Frank Siewert BESSY
0.05 μrad Accuracy Metrology for a New Generation of Reflective SR-Optics - François Polack SOLEIL
X-ray optics development and metrology at SOLEIL - Tetsuya Ishikawa Spring-8
Optics for Coherent X-Rays from SR and XFEL - Daniele Cocco ELETTRA
The photon beam transport system of the Fermi@elettra project - Peter Takacs BNL
Mirrors, Metrology, and . . . MAGIC! - Ali Khounsary APS
Nano-focusing @ APS - John Arthur LCLS/SLAC
(LCLS Challenges) - Yi-De Chuang LBNL
meV-Resolution Beamline (MERLIN) at the Advanced Light Source - Regina Soufli LLNL
X-ray optics development for the LCLS FEL