Advanced X-Ray Optics Metrology
for Nano-focusing and Coherence Preservation

Workshop Main Page


With permission from the speakers, we will make the workshop presentations available as we receive them.

Presentations

  • Howard Padmore LBNL
    X-ray Optics: New Challenges and Opportunities
  • Kazuto Yamauchi Osaka U
    Recent achievements and next strategies in hard-x-ray nano-focusing
  • Frank Siewert BESSY
    0.05 μrad Accuracy Metrology for a New Generation of Reflective SR-Optics
  • François Polack SOLEIL
    X-ray optics development and metrology at SOLEIL
  • Tetsuya Ishikawa Spring-8
    Optics for Coherent X-Rays from SR and XFEL
  • Daniele Cocco ELETTRA
    The photon beam transport system of the Fermi@elettra project
  • Peter Takacs BNL
    Mirrors, Metrology, and . . . MAGIC!
  • Ali Khounsary APS
    Nano-focusing @ APS
  • John Arthur LCLS/SLAC
    (LCLS Challenges)
  • Yi-De Chuang LBNL
    meV-Resolution Beamline (MERLIN) at the Advanced Light Source
  • Regina Soufli LLNL
    X-ray optics development for the LCLS FEL
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