"0.05 μrad Accuracy Metrology for a New Generation of Reflective SR-Optics,"
Presented by Dr. Frank Siewert, October 5, 2007.
Please do not use without permission and attribution.
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Download Original Presentation File: Siewert_ALS_UM.pdf
"0.05 μrad Accuracy Metrology for a New Generation of Reflective SR-Optics,"
Presented by Dr. Frank Siewert, October 5, 2007.
Please do not use without permission and attribution.
|
































Download Original Presentation File: Siewert_ALS_UM.pdf