for Nano-focusing and Coherence Preservation
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ALS Users' Meeting 2007 Workshop Friday, October 5th |
Organized by Valeriy Yashchuk & Kenneth Goldberg , |
Workshop Attendees, October 5th, 2007.
| View or Download the Presentations |
Thank You:
Ken and Valeriy would like to thank everyone who participated for what turned out to be a great meeting.
Workshop Abstract:
Focusing light to nanometer length scales and preserving the high brightness made available by third and fourth generation synchrotron sources requires significant advances in the quality of reflective EUV, soft x-ray and x-ray optics, and in the metrology used to optimize their fabrication and beam-line performance.
The goal of this workshop is to bring together researchers who create, test, and use advanced x-ray optics, and those who manufacture metrology instrumentation, to explore ways to reach 100 nano-radian and sub-angstrom surface quality. What in-situ and ex-situ metrology methods currently work best, and what new techniques can be developed? What metrology feedback does industry need to advance the state of the art, and how can we provide it?
With the importance of metrology gaining larger recognition in the short-wavelength-optics communities, this workshop will reveal opportunities for progress, collaboration, and the development of ideas toward the establishment of larger x-ray optics and metrology programs.
If you plan to attend, please R.S.V.P.
Invited Speakers:
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Howard Padmore, LBNL Kazuto Yamauchi, Osaka University Frank Siewert, BESSY François Polack, SOLEIL Ali Khounsary, APS John Arthur, LCLS, SLAC |
Tetsuya Ishikawa, Spring-8 Daniele Cocco, ELETTRA Peter Takacs, BNL Regina Soufli, LLNL Yi-De Chuang, LBNL | ||
| time | Session I | Speaker | Talk Title (title placeholder) |
| 1:00 | US Overview | Howard Padmore, LBNL | Synchrotron Optics: A historical perspective and new challenges |
| 1:20 | Japan Overview | Kazuto Yamauchi, Osaka University | Recent achievements and next strategies in hard-x-ray nano-focusing |
| 1:40 | Europe Overview | Frank Siewert, BESSY | 0.05 µrad accuracy metrology for a new generation of reflective SR-optics |
| 2:00 | SOLIEL | François Polack, SOLEIL | X-ray optics development and metrology at SOLEIL |
| 2:20 | break | * * * | |
| 2:30 | discussion | * * * | |
| Session II | |||
| 3:00 | Spring-8 | Tetsuya Ishikawa, Spring-8 | Optics for coherent x-rays from SR and XFEL |
| 3:15 | Optics for FEL / ELETTRA | Daniele Cocco, ELETTRA | The photon beam transport system of the Fermi@elettra FEL project |
| 3:30 | BNL (NSLS I/II) |
Peter Takacs, BNL | Mirror fabrication and metrology issues for nanofocusing applications |
| 3:45 | APS | Ali Khounsary, APS | Nano-focusing research the APS |
| 4:00 | SLAC | John Arthur, LCLS, SLAC | LCLS X-ray Source Properties and Optics Challenges |
| 4:15 | ALS | Yi-De Chuang, LBNL | Optics for MERLIN |
| 4:30 | LCLS | Regina Soufli, LLNL | X-ray optics development for the Linac Coherent Light Source FEL |
| Session III | |||
| 4:45 | break | * * * | |
| 4:55 | discussion | * * * | |
| 5:30 | Hawaiian Style Vendor Reception | ||
Participants:
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Matthew Abreu Erik Anderson Chris Anderson Joakim Andersson Andrew Aquila John Arthur Lahsen Assoufid David Attwood John Bozek Weilun Chao Yi-De Chuang |
Matthew Church Daniele Cocco Paul Denham Kenneth Goldberg Eric Gullikson Tetsuya Ishikawa Ali Khounsary Jonathan Kirschman Janos Kirz Jacek Krzywinski Yanwei Liu |
Alastair MacDowell Vladimir Martynov Brittany McClinton James Metz Dennis Mills Ryan Miyakawa Simon Morton Patrick Naulleau Art Nelson Howard Padmore Yuriy Platonov |
Francois Polack Senajith Rekawa Farhad Salmassi Frank Siewert Regina Soufli Peter Stefan Peter Takacs Tony Warwick Kazuto Yamauchi Valeriy Yashchuk Derek Yegian |
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